FEGSEM WITH CL AND EDS ACCESSORIES

Field Emission Gun Scanning Electron Microscope (JSM-IT800) with Cathodoluminescence (Delmic) and EDS (Oxford) Detectors

“The JSM-IT800 is a cutting-edge Field Emission Gun Scanning Electron Microscope (FEG-SEM) that delivers high-resolution imaging and advanced analytical capabilities. This model is equipped with a Delmic cathodoluminescence (CL) detector, allowing for the study of optical properties at the nanoscale by capturing light emitted from materials under electron beam excitation. Additionally, it features an Oxford Energy Dispersive Spectroscopy (EDS) detector, which provides precise elemental analysis and mapping, making it invaluable for material characterization. The JSM-IT800’s advanced electron optics, combined with these detectors, make it ideal for applications in materials science, geology, semiconductor research, and nanotechnology, where detailed surface morphology, compositional analysis, and luminescence properties are essential.”

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